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Title: "Design and Validation of a Zero-Field and Low-Field EDMR System"
Abstract: Electrically Detected Magnetic Resonance (EDMR) is a materials characterization technique that is used to investigate the electron spin dynamics of solids. External magnetic fields applied to particular semiconductor samples can result in Electron Paramagnetic Resonance (EPR) when the energy of the magnetic field matches the energy level splitting of the electrons found in the band structures of the sample. This resonance is usually detected by measuring absorbed microwave power, which necessitates high (.5-8T) magnetic fields. Unlike traditional EPR techniques, however, EDMR can be performed without measuring absorbed microwave power in high magnetic fields. Through Spin Dependent Recombination (SDR), a Spin-to-Charge conversion process, electron spin resonance can be detected electrically by measuring the electrical properties of the sample. In this paper, the design and validation of an EDMR system for use in Zero-Field or Low-Field regimes is described and tested.
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